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  1. fab-yield-defect-metrology-analytics fab-yield-defect-metrology-analytics Public

    SQL Server database modeling a semiconductor fab's manufacturing and metrology data, with analytical queries — commonality, SPC, and defect Pareto — that trace yield loss back to the root-cause too…

    TSQL

  2. Wafer-map-defect-classification Wafer-map-defect-classification Public

    Spatial defect pattern classification on WM-811K wafer maps, with process root-cause interpretation.

    Jupyter Notebook